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Wafer Map guide and FAQ

Usage, setup, data behavior, troubleshooting, licensing, and privacy answers for the Wafer Map Power BI custom visual.

Usage guide

Wafer Map usage guide

Use the following bindings and controls to keep the visual at the intended die-level grain and investigate wafer patterns efficiently.

Field bindings

  • Wafer hierarchy: Optional grouping hierarchy for wafers, lots, or other drill levels.
  • Die X: Required. The X coordinate in XY mode, or the sequence/order field when Die Y is not bound.
  • Die Y: Optional. When bound, Wafer Map renders true XY coordinates. When not bound, it uses X-only sequence mode.
  • Die Value: Optional. Numeric values used to color dies. Multiple fields can be bound and swapped from the toolbar.
  • Die Classification: Optional. Classification, bin, status, or pass/fail fields used for categorical coloring and yield metrics.
  • Count: Optional measure. Bind this when your model may return rolled-up rows and you need to compare displayed rows with total die count.

Toolbar

  • Magnifying glass: Use zoom and pan mode.
  • Square: Use brush selection mode. Drag over dies to select them in Power BI.
  • Reset arrow: Reset zoom, focus, and brush selection.
  • Swap arrows: Switch the displayed encoding when multiple value or classification fields are bound.
  • Pass / Fail: Highlight passing or failing dies when pass/fail classification can be resolved.

Legend and status panel

  • Legend focus: Click a categorical or binned legend item to focus that bucket. Click it again to clear focus.
  • Clear focus: Double-click empty toolbar or status-panel space to clear legend focus.
  • Status panel: Review the active scope, selected encoding, distribution chart, summary statistics, process limits, and legend.
  • Wafer focus: Click wafer labels or section headers to focus the distribution and statistics on that wafer or hierarchy section.
Important: Wafer Map assumes the provided hierarchy and Die X/Die Y mapping resolve to raw die-level data. If Power BI has already rolled up the data, the distribution and statistics may not represent raw dies because they are calculated from the rows provided to the visual. Bind a count measure to Count and confirm that Displayed Dies matches Total Dies in the status panel.

Frequently asked questions

Wafer Map support answers

What is Wafer Map?

Wafer Map is a Power BI custom visual for semiconductor wafer maps, die value maps, bin maps, and yield-loss review. It renders die-level rows by wafer hierarchy, die coordinates, die value, and optional classification fields so engineers can inspect wafer patterns inside standard Power BI reports.

Why does my wafer map show fewer rows than the dataset?

Wafer Map receives data after Power BI applies report filters, visual filters, bindings, aggregation, drill state, and data reduction. In unlicensed production trial mode, Wafer Map processes only the first 1,000 input rows and shows an in-visual diagnostic when rows are limited.

Which fields should I bind?

Bind Die X for the die X coordinate and, for true 2D wafer maps, bind Die Y for the die Y coordinate. Bind Wafer hierarchy when you need wafer, lot, or hierarchy grouping. Bind Die Value for the value rendered in each die cell, and optionally bind Die Classification fields for status or category overlays. A missing Wafer hierarchy is valid and renders valid rows under one default wafer.

Why does the visual show a diagnostic message?

Wafer Map validates the current field bindings and input rows before rendering. Diagnostics can appear for missing required coordinate roles, unusable coordinate values, trial row limiting, or settings that prevent the current data shape from being drawn.

If a diagnostic appears after changing fields or settings, check that Die X and Die Y are bound as coordinates, Die Value is a measure or value appropriate for the current map, and the current Power BI drill level contains the wafer hierarchy rows you expect.

Why does the map not look like a wafer?

Check that Die X and Die Y contain the intended raw coordinates, have compatible numeric or ordered values, and have not been aggregated unexpectedly. Also check orientation, coordinate mapping, invalid-row diagnostics, exclusions, and duplicate coordinates.

What is the difference between Displayed Dies and Total Dies?

Displayed Dies is based on rows the visual can render in the current scope. Total Dies can be supplied through the Count role. A mismatch can indicate that Power BI has aggregated rows, data reduction or a trial limit is active, invalid coordinates were excluded, or the count measure represents a different grain.

Can I analyze multiple wafers or hierarchy levels?

Yes. Bind hierarchy fields such as lot, wafer, station, batch, or panel. The visual can render and compare items present in the current Power BI data view and participate in supported hierarchy and drilldown workflows.

How are duplicate or invalid coordinates handled?

The visual reports coordinate and row diagnostics so you can identify duplicates, missing values, invalid rows, or excluded data. Resolve the data grain and coordinate mapping in the model when multiple source rows unintentionally resolve to the same die location.

How does process capability work?

Enable Process Capability for a numeric Die Value field and enter LSL and USL for the active field. When enough valid numeric observations are available, the status panel can calculate capability statistics such as Cp, Cpu, Cpl, and Cpk. Interpret capability only when the data, limits, sampling, and process assumptions are appropriate.

Does Wafer Map parse semiconductor files?

No. Wafer Map does not parse STDF, KLARF, SINF, SEMI E142, or other semiconductor file formats. Prepare die-level tabular data upstream in Power BI, MES/YMS, ETL, or query tooling, then bind the resulting fields to the visual.

Does Wafer Map send report data to external services?

No report data is stored on developer-controlled servers or sent to developer-controlled external services. Processing happens inside the user's Power BI visual session. Microsoft Power BI services may be used for hosting, licensing, persistence, and platform integration. See the privacy policy for details.